The Ellis R. Kerley Forensic Sciences Foundation offers a travel stipend for a deserving international forensic scientist for the purpose of attending the American Academy of Forensic Sciences meeting. The candidate will have the opportunity to learn, participate and share with fellow scientists during the meeting in hopes they will return to their country to share their knowledge and experience with their counterparts back home. 

The the winner will be awarded with the following:
  • $1,500 US dollars to cover travel expenses while attending at the AAFS meeting
  • Complimentary conference admittance to the AAFS meeting (Provided by the AAFS)
  • Invitation to Kerley Foundation/Anthropology section reception on Thursday evening (with opportunity to speak and share your experience at the meeting)
  • Opportunity for networking with other members of the scientific community
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Applications are due by close of business on April 30th of the year the award is granted and announcement of the winning recipient will be by August 15th of that same year. Applications and supporting materials must be submitted online. The application criteria and guidelines are provided below:​
APPLICANT CRITERIA
  • Must hold at least the B.A. degree or international equivalent, but preferably a more advanced degree.
  • The candidate must be involved with some aspect of forensic anthropology or anthropological casework, but does not need to hold a degree in Anthropology. Therefore, a forensic pathologist or odontologist, for example, could be eligible.  U.S. Citizens working or studying abroad do not qualify. ​
APPLICATION GUIDELINES
  • Submit an application which includes name and email address.
  • Submit a curriculum vitae,
  • Submit a letter of interest explaining why attending the AAFS meeting will benefit you and your community,
  • Provide a letter from a sponsor who will be attending that year’s meeting and will agree to “host” applicant. The host agrees to be a contact person to facilitate the visit and answer any questions.  
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Past International award recipients

Click to see past winners.